Process | EEX: Excitation |
Data type | cross section | uploaded on 2022-10-17 |
Comment | Integrated cross section for electron impact excitation of the 5p2 3P_0 ground state of atomic tin to the 5p.5d 3Do_1 state. |
Method | RCCC: Relativistic Convergent close-coupling |
Columns |
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Threshold | 5.670 eV |
Uncertainty | 7 % |
Ref |
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Data | Download |