Process | EEX: Excitation, EIN: Ionization, COM: Composite Process with Multiple Channels |
Channel |
|
Data type | cross section | uploaded on 2022-10-17 |
Comment | Total inelastic integrated cross section for electron scattering from the 5p2 3P_0 ground state of atomic tin (Sn* excited or ionised). |
Method | RCCC: Relativistic Convergent close-coupling |
Columns |
|
Uncertainty | 7 % |
Ref |
|
Data | Download |