Process | EIN: Ionization |
Data type | cross section | uploaded on 2022-10-17 |
Comment | Integrated cross section for total electron impact ionisation of the 5p2 1D_2 excited state of atomic tin. |
Method | RCCC: Relativistic Convergent close-coupling |
Columns |
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Threshold | 6.190 eV |
Uncertainty | 7 % |
Ref |
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Data | Download |